SigmaTech Metrology Solutions = Productivity Enhancement

Sigmatech offers a broad range of high precision metrology and inspection systems for the Semiconductor, MEMS, optical and other related industries for Production and R&D environments:

- Wafer Dimensional Metrology
Thickness, TTV, Bow, Warp measurement;
Wafer Characterization;
Layer thickness measurement;
Ultrathin wafer substrates,

- Wafer Surface Metrology
Non-contact Surface profilometry
Roughness measurement
MEMS
Bumps dimensions
Film Thickness
Step Heigth, cavities

News:

Next event:
Semicon West Booth #8419 West Hall Level2

Sigmatech announces New Line of Surface Metrology Systems.

Cost effective metrology solution with Multiple functions tool

Sigmatech: 10 years of innovation in metrology