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 9600K:
Thickness Measurement System Kit
The SigmaTech 9600K
is a kit form of the SigmaTech
9600M
manual, pneumatic, non-contact thickness measurement system. The
user supplies a PC. This system is ideal for measuring silicon,
gallium arsenide (GaAs), silicon on sapphire (SOS), and other wafers
used in the semiconductor industry as well as many other substrate
types and shapes.
Features
- Precision measurement within 0.5 micron
- One button operation
- No contact with the wafer surface
- Data storage for statistical analysis
- Granite block base for measurement stability
- One year warranty
Measurement specifications
- Resolution: 0.1 micron
- Accuracy: 0.5 micron
Options
Benefits
- When capacitive and laser systems cannot be used, SigmaTech's
APBP Technology provides high yield and the lowest cost-of-ownership
in the industry.
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