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Wafer Metrology Services

SigmaTech offers lab services for your metrology needs with fast turnaround and low cost. We measure a wide range of substrates, up to 15mm in thickness and 300mm in diameter. These substrates can be of any material in which TTV, center bow, warp, or topographical mapping is required with sub-micron accuracy.

Wafer Metrology Services Pricing

(per unit basis) (minimum of 10 units)

Measurement Thickness TTV, Ctr. Bow Ctr. Bow, Warp, TTV, Thickness Topographical Mapping (2D and 3D) Substrates (<200 microns) td> NRE Charges One Time Charge
50 - 100 mm diameter $25.00 add on $20.00 $20.00 Setup fee $250 $500

150 – 200 mm diameter and 156mm sq.

$40.00 add on $25.00 $25.00 Setup fee $350 $500
300mm and special shape wafers $100.00 add on $50.00 $50.00 Setup fee $350 $500
TSV and deep trench measurement $100.00 add on $50.00 $50.00 Setup fee $500 $750