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SigmaTech Inc. was created in 1996 to provide sub-micron, non-contact measurement solutions for non-conductive and Ultrathin materials to the Semiconductor and related industries.

Using its patented APBP technology (AutoPositioning Backpressure probe) SigmaTech’s systems provided unmatched capabilities for automated measurement of non conductive materials such as GaAs, Sapphire, glass etc.. and for wafers with large bow and extended warp and broad thickness range.

Industry-Driven Evolution

The Semiconductor industry continually faces quality control challenges requiring reliable, cost-effective solutions in a high volume production environment.
SigmaTech is uniquely responding to the fast evolving needs of the Semiconductor Industry with innovative and unique metrology solutions.

Today SigmaTech with Worldwide installations with leading semiconductors companies is at the forefront of the dimensional metrology industry.

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