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 9600M: Manual
Thickness Measurement System
The SigmaTech 9600M
is a manual, pneumatic, non-contact thickness measurement system.
The 9600M combines
a non-contact pneumatic sensor with a computer to log measurement
data and sample identification. The granite base provides the 9600M
with a stable measurement platform. The patented pneumatic sensor
uses an air bridge for sub-micron measurement accuracy. This system
is ideal for sapphire (SOS) and other wafers used in the semiconductor
industry as well as other substrate types and shapes.
Benefits
- SigmaTech's APBP Technology provides high yield and the lowest
cost- of-ownership in the industry.
- Very flexible for many kinds of substrates
- Measures clear, conductive, non-conductive, wet or dry substrates
Features
- Precision measurement: 0.5 microns
- One button operation
- No contact with the substrate
- Data Storage for analysis
- Granite block base for stability and repeatability
- Software based on Microsoft Windows
- One year warranty
Measurement Specifications
- Resolution: 0.1 micron
- Accuracy: 0.5 micron
Options
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