Key Applications.

Sigmatech offers metrology solutions to a broad range of standard and specific applications in the field of semiconductor wafers, materials and optics.
Using multiple sensing technologies, they are virtually no limits to the capabilities:

• Conductive or non-conductive substrates
• Reflective or non reflective
• Polished or non polished
• Wet or dry environment
• Round, square or rectangle
• Sizes up to 600mm
• Non contact solutions with automated calibration

• Wafer Characterization 2” to 12”
• Highly warped wafers
• Sub-nanometer roughness
• Ultrathin wafers substrates
• SOI
• MEMS, Bumps

• Wafer on sawframe
• Substrates with holes pattern
• Bumps, solder ball dimension
• Wafer bounded on Glass or Copper
• Extremely warped wafers (up to 10mm)
• Square wafers
• Micro-bumps topography
• Wet environment