Metrology Services

SigmaTech offers lab services for your metrology needs with fast turnaround and low cost. We measure a wide range of substrates, up to 15mm in thickness and 300mm in diameter. These substrates can be of any material in which TTV, center bow, warp, or topographical mapping is required with sub-micron accuracy.

Metrology Services Pricing (per unit basis)

Measurement	Thickness TTV, Ctr. Bow	Ctr. Bow, Warp, TTV, Thickness Topographical Mapping (2D and 3D)	Ultra Thin Substrates (<200 microns)	NRE Charges	One Time Charge
200- 300 mm diameter	$40.00	$25.00	$100.00	Setup fee $500	$500
50–200 mm diameter	$20.00	$15.00	$50.00	Setup fee $350	$500

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Notes:
Minimum charge is 10 wafers

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